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Preparation of highly conducting and transparent cadmium tin oxide  thin films by vacuum evaporation technique on glass substrate with thickness of (300, 600)nm is reported. The effect of thickness on structural, optical, and electrical properties of the films was investigated by using different techniques such as X-ray diffraction, atomic force microscopy, optical transmittance, and Hall measurement. The X-ray diffraction (XRD) studies revealed that the films are polycrystalline in nature with cubic structure and there are strong peaks at the direction (311), the intensity of the peaks increases with increasing thickness. The grain size varies between 19.1 and 21.4nm. The surface morphological was investigated by atomic force microscopy (AFM), which revealed the crystalline nature of the films. The optical parameters of the prepared films as transmittance, optical energy gap, refractive index, extinction coefficient, and the dielectric constants were found to be affected by varying the thickness. The resulting films show  transmission in the visible region DC conductivity and Hall effect measurement as a function of thickness have been studied for these films DC conductivity measurement have been showed that the conductivity increases from 8.69 to 11.62  when the film thickness increased. Hall Effect results showed that thin films were n-type. Also the charge carrier concentration increases with increasing thickness. The Hall mobility has been calculated, and it is decreased with increasing film thickness. The drift velocity of these films decreases with increasing film thickness. 

 thin films, AFM, vacuum evaporation, optical and electrical properties.